Summary
Dive into the fascinating thin film material analysis world through the powerful X-ray diffraction (XRD) technique. Explore the fundamentals, practical applications, and hands-on skills needed for basic crystal structure identification, stress state evaluation, or data interpretation using parameters gained during XRD analysis. Within this module, the basic principles of XRD, as well as helpful insights on data interpretation and valuable applications, will be provided. Whether you are a scientist, researcher, or enthusiast new to these techniques, this course will enable your skills in conceiving XRD data.
Topics
- Basic principle of using X-rays for producing diffraction data (Bragg’s law)
- Overview on different XRD techniques (different sources and geometries)
- Data interpretation and useful methods for your daily business with X-ray diffraction
- Case studies for evaluating textures coefficients, FWHM, sin²psi, etc
Instructor
Rainer Hahn
Senior Scientist
Technische Universität Wien, Austria
