Technical Symposium CM
This Symposium focuses on recent advances in microstructural, chemical, electrical, optical, and mechanical characterization of coatings and thin films, as well as advanced modelling and computation techniques, which enhance our understanding of the fundamental structure-property-processing relationships. In addition, the symposium will cover topics related to high-throughput thin film development, including combinatorial synthesis, automated characterization, and data science approaches such as machine learning or artificial intelligence for large data processing. Of interest are contributions that either highlight the application of recent advances in analytical methods, characterization techniques and nano-mechanical testing methods for coating evaluation, or present advanced and innovative modelling techniques to understand coating properties.
CM1: Spatially-resolved and in situ Characterization of Thin Films, Coatings and Engineered Surfaces
This session focuses on advanced spatially resolved methods for characterizing the structure, chemistry, composition, and microstructure of thin films, coatings, interfaces, and engineered surfaces. Particular emphasis is placed on approaches that deepen the understanding of film growth-structure relationships, local heterogeneity, interface formation, and microstructural evolution. Contributions on 2D- and 3D- characterization of small volumes are especially encouraged, including APT, analytical and high-resolution TEM, FIB/SEM and FIB/EBSD tomography, ToF-SIMS 3D mapping, correlative microscopy, and multimodal reconstruction methods. The session also welcomes in situ and operando studies of structural, chemical, and microstructural evolution during growth, processing, or post-deposition treatments. Relevant methods include ellipsometry, X-ray and neutron diffraction, scattering and reflectometry, micro-Raman spectroscopy, and other spatially, temporally, or depth-resolved techniques. Studies involving mechanical, thermal, electrical, chemical, or environmental stimuli are within scope when the primary objective is to reveal changes in structure, composition, phases, defects, interfaces, or morphology, rather than to measure mechanical or physical properties.
CM1 Invited Speakers:
- Vivek Devulapalli, Empa, Switzerland
- Lorenzo Rigutti, Université de Rouen Normandie, France
- Peter Schweizer, MPI for Sustainable Materials, Germany, “In Situ TEM Characterization of Defects in Thin Films”
- Matthijs Van Spronsen, Diamond Light Source, UK
CM2: Advanced Mechanical Testing of Surfaces, Interfaces, Thin Films, Coatings, and Small-Scale Volumes
Modern applications require advanced materials that combine properties often seen as mutually exclusive, such as high strength and ductility, while also resisting wear, fatigue, fracture, and extreme environments in combination with functional properties. In this context, this session focuses on cutting-edge mechanical and mechanical-physical characterization techniques for surfaces, interfaces, thin films, coatings, and small-scale materials. Emphasis is placed on the development and application of novel methods that probe mechanical properties as well as electrical, thermal, magnetic, and interfacial properties, and/or exploring their interconnection with the mechanical behavior. Contributions that introduce innovative nanoindentation and micro- and nano-mechanical approaches and advanced physical characterization – particularly on coatings, thin films, and near-surface regions, including those prepared by focused ion beam (FIB) or other lithographic techniques – are highly encouraged. Studies that provide quantitative determination of mechanical properties, residual stresses, interface adhesion, fatigue, and fracture toughness as well as studies that investigate relationships between microstructure and physical properties are particularly relevant. The coupling of mechanical/physical testing –such as in situ experiments within SEM, TEM, Raman, and X-ray beamlines – are also welcome. Moreover, we especially invite papers that explore characterization under non-ambient and extreme conditions, including high and cryogenic temperatures, radiation exposure, hydrogen environments, cyclic loading, and high strain rates. By integrating advanced experiments and characterization, the symposium aims to provide a comprehensive platform for understanding, predicting, and qualifying advanced materials from a truly multi-properties and multiscale perspective.
CM2 Invited Speakers:
- Anwesha Kanjilal, Max Planck Institute for Sustainable Materials, Germany
- Eugen Rabkin, Technion Israel Institute of Technology, Israel
- Eric Hintsala, Bruker Hysitron, Inc., USA
- Jutta Luskch, University of Saarland, Germany, “Micromechanical Fatigue of Nanostructured Metal Thin Films”
CM3: Data-Driven Thin Film Design: High-Throughput Experimentation, Simulation, and Machine Learning
This session explores the synergistic integration of high-throughput experimentation, advanced computational methods, and data-driven approaches for accelerated thin film and coatings development. On the one hand, the session will cover the full spectrum of accelerated materials development from rapid materials synthesis—such as combinatorial or autonomous thin film deposition—to automated characterization techniques and the efficient management and analysis of large experimental datasets. Contributions are invited on recent advances in high-throughput research methods, including the application of data science, machine learning, and artificial intelligence to experimental workflows. On the other hand, the session covers computational and simulation tools as well as data science approaches for knowledge-based materials design and discovery. Here, topics of interest include the use of simulations and machine learning to understand material structures and properties across scales, rapid screening of compositional landscapes, and the generation, curation, and exploration of big materials data from both experiments and computations. By bridging experimental high-throughput synthesis, characterization, and computational modeling, this session aims to showcase the latest developments and foster interdisciplinary collaboration in data-driven thin film design.
CM3 Invited Speakers:
- Taylor Sparks, University of Utah