Abstract Submission Deadline: October 30, 2026
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      • Lecture Series: Plenary
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      • Symposium CM: Advanced Characterization, Modelling and Data Science for Coatings and Thin Films
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Electron Microscopy (T4)- 4/22/26

Wednesday, April 22, 8:00 a.m.-10:05 a.m.

Summary

Explore the captivating area of electron microscopy through this comprehensive tutorial on Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), and related analytic techniques. Delve into the core principles, practical applications, and essential hands-on techniques for high-resolution imaging, elemental analysis, and nanoscale material characterization. This session will cover fundamental concepts of SEM and TEM and offer valuable guidance on data acquisition, interpretation, and advanced analytical methods. Whether you are a researcher, engineer, or newcomer, this tutorial will equip you with the expertise to utilize electron microscopy for your scientific investigations effectively.

Topics

  • Using electrons in imagining techniques
  • Physical limits and length scales in EM techniques: Fundamentals and overview for essential methods (for SEM, SE & BSE, and in TEM, BF & DF, SAED, EELS)
  • Chemical analysis using EM techniques (focus on EDX)
  • Sample preparation and EM data assessment

Instructor

Rainer Hahn

Senior Scientist
Technische Universität Wien, Austria

Advance Registration Recommended!

Cost Per Track: $300
Cost Per Module: $100

Module(s) Include: Link to Course Notes (PDF)

You may select any combination of modules during the registration process

REGISTER

Key Dates

Call for Abstracts Deadline:
October 30, 2026

Awards Nomination Deadline:
October 30, 2026

Author Notifications:
December 14 , 2026

Early Registration & Housing  Deadline:
March 1, 2027

Manuscript Deadline:
July 31, 2027

Downloads

  • Code of Conduct (PDF)
  • Call for Abstracts (PDF)
  • Copyright Agreement (PDF)

Contact

CONFERENCE MANAGEMENT
Yvonne Towse

Conference Administrator

Della Miller 
Conference Manager
icmctf@icmctf.org

EXHIBITS
Ryan Foley and Bob Jonas
exhibits@avs.org

 

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